Real World Java EE Night Hacks

The surprisingly successful book Real World Java EE Patterns–Rethinking Best Practices discusses the rethinking of legacy J2EE patterns. Now, Real World Java EE Night Hacks–Dissecting the Business Tier walks you through the Java EE 6 best practices and patterns used to create a real world application called “x-ray.” X-ray is a high-performance blog statistics application built with nothing but vanilla Java EE 6 leveraging the synergies between the JAX-RS, EJB 3.1, JPA 2, and CDI 1.0 APIs. Topics covered include:

  • A brief introduction into the core principles of Java EE 6 (EJB 3.1, CDI, JPA, JTA,Dependency Injection, Convention over Configuration, interceptors, transactions, REST) using real world code
  • Unit and integration testing of Java EE 6 applications using JUnit and ScalaTest
  • Using interceptors for performance measuring and monitoring
  • Creating mocks with Mockito for EJB 3.1, CDI, JPA, and JAX-RS
  • Developing embedded integration tests with Arquillian
  • Productive use of JAX-RS, Contexts and Dependency Injection, EJB 3.1, and JPA
  • RESTful services and REST clients with Java EE 6
  • Convention over Configuration with Java EE 6
  • Effective component configuration with CDI and Convention over Configuration
  • Plug-in implementation with CDI
  • Transactional pub/sub without JMS based on CDI and EJB 3.1
  • Continuous integration with Maven 3, Mercurial/Git, and Hudson/Jenkins
  • Implementing configurable timers and asynchronous batch processing
  • Eventual consistency and high-performance deferred writes with Java EE 6
  • Real-time client and server monitoring with JMX and REST
  • Functional testing with FitNesse
  • Performing stress and load tests
  • Simplest possible, but maintainable, Java EE 6 design and architecture

Real World Java EE Night Hacks – Dissecting the Business Tier will benefit experienced developers and architects interested in code, not PowerPoint slides :-).

Book Details

  • Paperback: 167 pages
  • Publisher: Adam Bien (April 2011)
  • Language: English
  • ISBN-10: 1447677918
  • ISBN-13: 978-1447677918
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